Workshop on Materials Characterization Techniques for XRD and XRF (ICMAB, 19th May 2014)

Worshop XRD-XRF ICMAB May2014


As part of RADDEL training programme activities, a workshop in materials characterization techniques will be held at ICMAB-CSIC on 19th May 2014:


The workshop includes the contribution of members of ICMAB-CSIC, ITJA-CSIC, ALBA, ICN2 and of industrial partners PARALAB and RIGAKU. The workshop will deal with X-ray diffraction (XRD) and X-ray Fluorescence (XRD), two available techniques for the characterization of materials.




09:00 Registration

09:30 Presentation of the seminar

09:45 Prof. Jordi Rius (ICMAB-CSIC): "Brief introduction to lab XRD and description of the new software for structure solution and refinement of polycrystalline materials downloadable from ICMAB webpage"

10:10 Dr. Carlos Frontera (ICMAB-CSIC): "Structure refinement of thin films using lab equipment"

10:30 Dr. Raine Pulkkinen (Sales manager of RIGAKU): "New diffraction equipment and last generation of detectors"

11:15 Coffee break

11:30 Dr. Ignasi Queralt (ITJA-CSIC): "General introduction to X-ray Fluorescence spectroscopy (XRF). Its application to materials characterization"

12:15 Dr. Pol de Pape (Rigaku Europe): "Various types of XRF spectrometers"

13:00 Short communications

Prof. Elies Molins (Director of crystallography department, ICMAB-CSIC): "Single crystal diffraction and electron density studies"

Dr. Oriol Vallcorba (ALBA): "New structure solution possibilities of organic compounds from laboratory powder diffraction data"

Lcda. Anna Crespi (ICMAB-CSIC) "New XRD applications in transmission mode at ICMAB-CSIC"



The workshop is free to attend but registration is compulsory:


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